Products

15 products

CodeDescriptionUnit
NIST-656Silicon Nitride Powders for Quantitative Analysis by Powder Diffraction2 x 10 g
NIST-674bX-Ray Powder Diffraction Intensity Set (Quantitative Powder Diffraction Standard)10 g (powder)
NIST-675Line Position, Mica (XRD)7,5 g
NIST-676aAlumina Powder for Quantitative Analysis by X-ray Diffraction20 g
NIST-1976bAlumina plate - Instrument response Standard for X-Ray Powder Diffraction1 disc
NIST-1990Single Crystal Diffractometer Alignment Standard - Ruby Spheres3 spheres
NIST-1994Standard Silicon Single Crystal Wafer for Crystalline Orientation100-mm wafer
NIST-1995Standard Sapphire Single Crystal Wafer for Crystalline Orientation50-mm wafer
NIST-2000Calibration standard for high-resolution X-Ray Diffraction1 block
NIST-640eSilicon powder line position + line shape standard for powder diffraction7,5 g
BAM-EDS-TM002Test material for the performance check of an X-ray spectrometer attached to a SEM, compact material, dimensions 8 mm x 8 mm x 0,5 mmea
BAM-EDS-TM002 with Software (Individual license)Test material for the performance check of an X-ray spectrometer attached to a SEM, compact material, dimensions 8 mm x 8 mm x 0,5 mm + CD-ROM (in English und German)ea
BAM-EDS-TM002 with Software (Multiple license)Test material for the performance check of an X-ray spectrometer attached to a SEM, compact material, dimensions 8 mm x 8 mm x 0,5 mm + CD-ROM (in English und German)ea
NIST-1979Powder Diffraction Line Profile Standard for Crystallite Size Analysis (Nano-Crystalline ZnO Powder)2 x 3 g
NIST-3600Absolute Intensity Calibration Standard for Small-Angle X-ray Scatteringcoupon