Products
15 products
| Code | Description | Unit |
|---|---|---|
| NIST-656 | Silicon Nitride Powders for Quantitative Analysis by Powder Diffraction | 2 x 10 g |
| NIST-674b | X-Ray Powder Diffraction Intensity Set (Quantitative Powder Diffraction Standard) | 10 g (powder) |
| NIST-675 | Line Position, Mica (XRD) | 7,5 g |
| NIST-676a | Alumina Powder for Quantitative Analysis by X-ray Diffraction | 20 g |
| NIST-1976b | Alumina plate - Instrument response Standard for X-Ray Powder Diffraction | 1 disc |
| NIST-1990 | Single Crystal Diffractometer Alignment Standard - Ruby Spheres | 3 spheres |
| NIST-1994 | Standard Silicon Single Crystal Wafer for Crystalline Orientation | 100-mm wafer |
| NIST-1995 | Standard Sapphire Single Crystal Wafer for Crystalline Orientation | 50-mm wafer |
| NIST-2000 | Calibration standard for high-resolution X-Ray Diffraction | 1 block |
| NIST-640e | Silicon powder line position + line shape standard for powder diffraction | 7,5 g |
| BAM-EDS-TM002 | Test material for the performance check of an X-ray spectrometer attached to a SEM, compact material, dimensions 8 mm x 8 mm x 0,5 mm | ea |
| BAM-EDS-TM002 with Software (Individual license) | Test material for the performance check of an X-ray spectrometer attached to a SEM, compact material, dimensions 8 mm x 8 mm x 0,5 mm + CD-ROM (in English und German) | ea |
| BAM-EDS-TM002 with Software (Multiple license) | Test material for the performance check of an X-ray spectrometer attached to a SEM, compact material, dimensions 8 mm x 8 mm x 0,5 mm + CD-ROM (in English und German) | ea |
| NIST-1979 | Powder Diffraction Line Profile Standard for Crystallite Size Analysis (Nano-Crystalline ZnO Powder) | 2 x 3 g |
| NIST-3600 | Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering | coupon |