Products

11 products

CodeDescriptionUnit
NIST-656Silicon Nitride Powders for Quantitative Analysis by Powder Diffraction2 x 10 g
NIST-674bX-Ray Powder Diffraction Intensity Set (Quantitative Powder Diffraction Standard)10 g (powder)
NIST-675Line Position, Mica (XRD)7,5 g
NIST-1976bAlumina plate - Instrument response Standard for X-Ray Powder Diffraction1 disc
NIST-1990Single Crystal Diffractometer Alignment Standard - Ruby Spheres3 spheres
NIST-1994Standard Silicon Single Crystal Wafer for Crystalline Orientation100-mm wafer
NIST-1995Standard Sapphire Single Crystal Wafer for Crystalline Orientation50-mm wafer
NIST-2000Calibration standard for high-resolution X-Ray Diffraction1 block
NIST-2012Calibration Standard for High Resolution X Ray Diffractionwafer
NIST-640eSilicon powder line position + line shape standard for powder diffraction7,5 g
NIST-1979Powder Diffraction Line Profile Standard for Crystallite Size Analysis (Nano-Crystalline ZnO Powder)2 x 3 g